Hefei ZC Optoelectronic Technology Co., Ltd.
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Defect Inspection System For Planar Components

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ProductIntroduction

The Defect Inspection System For Planar Components (AOSI-4000F ) is designed for fully automated visual quality inspection of planar optical components. It features high automation, batch loading/unloading, intelligent detection, simulation testing, and generates inspection reports for each component. The equipment also produces inspection logs for analyzing quality trends, defect statistics, and process optimization over time.

ProductParameters

Defect Inspection System For Planar Components

Model

AOSI-4000F

Sample Type

Flat,Spherical,Aspherical lenses

Typical Sample Size*1

5mm ~ 30mm

Missed Defect Rate

≤1%

False Alarm Rate

≤10%

Max Throughput

2400pcs/h @ 10mm, 40/20

Loading/Unloading

Fully automated, customizable user interface

Compliance Standards*2

MIL-PRF-13830B

Rated Power

8KW

Power Supply

220V, 50Hz

Compressed Air

0.6MPa~0.8MPa, 300L/Min

Dimensions*3

1865mm ×1565mm × 2165mm

Weight

1000Kg

*1:Sample size can be customized.

*2:Detection standards are adjustable per requirements.

*3:Dimensions are adaptable to installation conditions.

Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.

ProductFeatures
  • High-Sensitivity Optical Detection System
    1
  • Flexible Detection Modules
    2
  • Standard Compliance
    3
  • High Automation
    4
  • Adaptive Collector
    5
  • Inspection Log Analytics
    6
  • High-Protection Environment
    7
  • One-Click Operation
    8
  • AI Algorithms
    9
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