Inspection Equipment For Glass Wafers (NOVA-2000-G) is made for finding defects in transparent or semi-transparent wafer substrates, like glass and lithium niobate wafers. It can spot defects such as particles, scratches, pits, bumps, chipped edges, and cracks. This is important for controlling the quality of transparent wafers. The system uses different detection methods,like bright field and dark field. It gives reliable defect info for all kinds of problems. By using automatic defect detection and classification algorithms, it gets defect data such as the type, size, location, and stats. Then it makes a wafer defect report for users to judge the quality.

Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.