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ProductIntroduction
The Subsurface Defect Instrument (SSDI-2000) integrates multiple detection modes, including optical microscopic imaging, laser confocal imaging, and optional fluorescence confocal imaging. It is designed for detecting and analyzing surface and subsurface defects in optical components, enabling layered detection of samples in the depth direction.
ProductParameters
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Subsurface Defect Instrument |
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Model |
SSDI-2000 |
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Detection Sensitivity |
≤200nm |
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Lateral Resolution |
≤300nm |
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Longitudinal Resolution |
≤1μm |
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Maximum Sample Size |
100mm×100mm, or customized |
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Defect Longitudinal Resolution |
≤1μm |
Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.
ProductFeatures
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Supports auto-focusing.1
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Equipped with multiple detection modes.2
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Supports defect depth analysis.3
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Distinguishes between surface and subsurface defects.4
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Various detection modes can be freely switched, and a selected area from an image in one detection mode can be used for detection in other modes to observe the characteristics of defects under different detection modes.5
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