Hefei ZC Optoelectronic Technology Co., Ltd.
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Multimodal Surface Defect Inspection Instrument

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ProductIntroduction

The Multimodal Defect Inspection Instrument (MMDI-2000) combines full-aperture rapid defect identification with sub-aperture high-sensitivity, high-resolution microscopic imaging. It statistically analyzes the scale, location, and morphology of defects. Users can employ different detection modalities such as photothermal weak absorption and microscopic imaging to focus on areas of interest and obtain defect information. It can also utilize differential interference combined with microscopic imaging technology to distinguish between bumps and pits.

ProductParameters

Multimodal Surface Defect Detector

Model

MMDI-2000

Maximum Sample Size

100mm×100mm (L × W), or customizable

Detection Modes

Laser scattering, photothermal absorption, microscopic imaging;

customizable combinations available.

Defect Sensitivity

≤0.3μm

Photothermal Absorption Sensitivity

≤10ppb

Photothermal Defect Sensitivity

≤10μm

Photothermal Pump Source Wavelengths

266nm, 355nm, 532nm, 1064nm or customized

Microscopic Imaging Lateral Resolution

≤0.5μm

Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.

ProductFeatures
  • Automated detection.
    1
  • Multi-mode scanning expansion capabilities.
    2
  • Supports arbitrary area selection for testing on the screen.
    3
  • Compatible with planar, spherical, and aspherical components.
    4
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