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The Scattering Defect Inspection Instrument For Large-Aperture Optics (LSDI-2000-LA, LSDI-3000-C) is designed for surface defect detection and analysis of polished large-aperture optical materials, semiconductor materials, metals, and other materials. This non-contact, fully automated detection instrument enables rapid identification of surface characteristics such as scratches, pits, and contaminants.
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Scattering Defect Inspection Instrument For Large-Aperture Optics |
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Model |
LSDI-2000-LA |
LSDI-3000-C |
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Detection Method |
Fully automated |
Fully automated |
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Detection Sensitivity |
≤200nm |
≤200nm |
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Sample Type |
Flat surfaces |
Spherical/Aspherical surfaces |
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Sample Size |
≤ 500mm × 500mm × 80mm (L × W × H) |
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Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.
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High-speed detection.1
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High sensitivity.2
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High repeatability.3
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Fully automated operation.4
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Automatic classification based on different standards.5
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Customizable development of equipment integrating multiple detection technologies to meet client-specific requirements.6
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