The Large-Aperture Component Absorption Defect Instrument (PTM-2000-LA) utilizes photothermal scanning microscopic imaging technology for the detection and analysis of surface and subsurface absorption defects in various large-aperture solid components,particularly in large-aperture optical films and optical components. This system is a non-contact, high-resolution and fully automated detection instrument, which can perform precise detection and analysis in ultraviolet, visible or infrared wavelength bands according to specific user requirements.
Large-Aperture Component Absorption Defect Instrument |
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Model |
PTM-2000-LA |
Detection Sensitivity |
≤10ppb |
Detection Wavelengths |
266nm, 355nm, 532nm, 1064nm or customized |
Spatial Resolution |
≤10μm |
Sample Size |
≤500mm×500mm (L × W) or customized. |
Optical Microscopic Imaging System Resolution (optional) |
≤1μm |
Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.
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High sensitivity.1
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High repeatability precision.2
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One-click operation.3
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Easy sample replacement without recalibration.4
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2D (3D) high-resolution imaging of absorption defects.5
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Stability analysis of samples or selected defects under laser irradiation.6