中文
英文
The Large-Aperture Component Absorption Defect Instrument (PTM-2000-LA) utilizes photothermal scanning microscopic imaging technology for the detection and analysis of surface and subsurface absorption defects in various large-aperture solid components,particularly in large-aperture optical films and optical components. This system is a non-contact, high-resolution and fully automated detection instrument, which can perform precise detection and analysis in ultraviolet, visible or infrared wavelength bands according to specific user requirements.
|
Large-Aperture Component Absorption Defect Instrument |
|
|
Model |
PTM-2000-LA |
|
Detection Sensitivity |
≤10ppb |
|
Detection Wavelengths |
266nm, 355nm, 532nm, 1064nm or customized |
|
Spatial Resolution |
≤10μm |
|
Sample Size |
≤500mm×500mm (L × W) or customized. |
|
Optical Microscopic Imaging System Resolution (optional) |
≤1μm |
Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.
-
High sensitivity.1
-
High repeatability precision.2
-
One-click operation.3
-
Easy sample replacement without recalibration.4
-
2D (3D) high-resolution imaging of absorption defects.5
-
Stability analysis of samples or selected defects under laser irradiation.6
Read more
High Transmittance Reflectance Inspection Instrument For Large-Aperture Optics
Multi-Modal Defect Inspection Instrument For Large-Aperture Optics
Scattering Defect Inspection Instrument For Large-Aperture Optics
Multimodal Surface Defect Inspection Instrument
Subsurface Defect Inspection Instrument
