Hefei ZC Optoelectronic Technology Co., Ltd.
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Absorption Defect Inspection Instrument For Large-Aperture Optics

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ProductIntroduction

The  Large-Aperture  Component  Absorption  Defect   Instrument (PTM-2000-LA) utilizes photothermal scanning microscopic imaging technology for the detection and analysis of surface and subsurface absorption defects in various large-aperture solid  components,particularly in large-aperture optical films and optical components. This system is a non-contact, high-resolution and fully automated detection instrument, which can perform precise detection and analysis in ultraviolet, visible or infrared wavelength bands according to specific user requirements.

ProductParameters

Large-Aperture Component Absorption Defect Instrument

Model

PTM-2000-LA

Detection Sensitivity

≤10ppb

Detection Wavelengths

266nm, 355nm, 532nm, 1064nm or customized

Spatial Resolution

≤10μm

Sample Size

≤500mm×500mm (L × W) or customized.

Optical Microscopic Imaging System Resolution (optional)

≤1μm

Note: We can provide customized instruments of the same type and related testing solutions according to customer requirements.

ProductFeatures
  • High sensitivity.
    1
  • High repeatability precision.
    2
  • One-click operation.
    3
  • Easy sample replacement without recalibration.
    4
  • 2D (3D) high-resolution imaging of absorption defects.
    5
  • Stability analysis of samples or selected defects under laser irradiation.
    6
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